High temp. DC Burn-in System for Small&Medium Power Microwave Device/Module
Design for HBT&pHEMT(enhanced / depleted) devices of running DC burn-in test with heating
power below 1W and Ta between 50 ℃ and 200 ℃.
Each DUT's Vd is supplied by standalone program-controlled DC/DC converter. and the Vgs is automatically supplied by PC software regarding Id value. The software system automatically stables
each DUT's Id, Vds to ensure that each DUT is adjusted to the same test condition. DUT is relatively independent, which eliminat device oscillation.
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