The system can perform steady state life and power burn-in screening for cermet microwave power

FET with rated power below 150W and Tc controlled  between 70℃~150℃

It adopts constant current priority test circuit,together with the full shielding and anti high&low

frequency oscillation design of fixture(the case is required to be grounded).Any open/short circuit,

leakage at any time & any two poles of the device shall not damage the device&equipment, or effect

other devices in test.

Each DUT's Vdd PS is supplied by standalone program-controlled DC/DC converter. and the Vgs is automatically supplied by PC software regarding Id value.  The software system automatically stables

each DUT's Id, Vds and Tc to ensure that each DUT is adjusted to the same test condition. DUT is

relatively independent, which eliminat device oscillation.