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BTD-E800(16 slots)
Discrete Device Burn-in System -Standard type
The system is designed to perform CFOL / IOL/ Forward Power Burn-in Screening for various packages' semiconductor discrete device such as small&midium power diode,transistor,FET,SCR etc.
Test Standard
Product Features
Product Parameters
Chamber
Type
Air-cooled chamber
Dimension
600*330*610(mm)
Air circulating
Horizontal air circulating design
QTY.
2 sets
Temperature
Ambient
Capacity
Zone QTY.
4
Slot
16
DUT per slot/ Total
64/1024
Power Supply
QTY.
V b *4 sets + V c *4 sets
Output
Max120V
Driver Board
QTY.
16pcs
Constant current source /slot
16 channels
Constant current source range
0~1.00A/channel
Current detection range
0.0mA~10.00A;accuracy:±(1% + 1LSB)
Voltage detection range
0.0V~199.9V;accuracy:±(1% + 1LSB)
Burn-in Board
Substrate material
Standard substrate (100℃)
Dimension
290 * 452 (mm)
Equipment
Dimension
1300W*1200D*1900H(mm)
Electrical requirement
A.C.220V±10% / 50Hz
Power/Weight
8KW / 500kg
Others
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