BTD-E800(16 slots)
                        
                    
                    Discrete Device Burn-in System -Standard type
                    
                        The system is designed to perform CFOL / IOL/ Forward Power Burn-in Screening for various packages' semiconductor discrete device such as small&midium power diode,transistor,FET,SCR etc.
                    
                    
                    
                    
                        
                        Test Standard