The system is designed to perform CFOL/IOL test and power burn-in screening for diodes in various packages & various Im range. such as zener diode,TVS transistor, small current diode,LED, etc.
Test Standard
Product Features
E-load *12
12 constant current E-load per slot with HV protection , ensure the high precise test current of each DUT.
Auto-loading Burn-in Parm.
Auto-apply Voltage and other parm.to the DUT according to the software setting.
Support DUT series connection
up to 4 devices series connection in one DUT position, which helps to increase the total capacity.
Universal BIB
With Mother-Daughter board design, it only requires adjustment of sub-board to fit different packages. which reduce the long-term use cost.
Product Parameters
Chamber
Type
Air-cooled chamber*2
Dimension
600*330*610(mm)
Air circulating
Horizontal air circulating design
Temperature
Ambient
Capacity
Zone QTY.
8-16
Slot
16
DUT per slot/ Total
12/192
Power Supply
QTY.
8 sets (16 sets optional)
Output
300V / 8A;600V / 4A
Driver Board
QTY.
16 pcs
IF detection
Range:0.0mA~1000mA;Accuracy:±(1%+1LSB)
VF detection
Range:0.00V~300.0V(Max600V);Accuracy:±(1%+1LSB)
E-load QTY.
12 channels per slot/ Total 192 channels
E-load current range
0.01A~1.00A
Max E-load power
30W per channel
Burn-in Board
Substrate material
Standard High Tg substrate
Socket
Socket with high temperature resistant, anti-oxidation and fatigue resistant materials