Design for various packages' FLASH, SRAM, DRAM(Synchronous dynamic random access
memory),DDR(Double rate SDRAM),RDRAM,etc. running operation life test and
high temp.dynamic burn-in screening, as well as supporting of TDBI function.
Features:
1,Outstanding editing ability of MEMORY burn-in test pattern
2,Testing each unit and recording failure one.
Custom&Dedicated Equipment |
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