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BTD-E900(Crystal oscillator)
Crystall Oscillator High Temp. Burn-in System

The system can perform high temp.dynamic burn-in screening and life test for Quartz crystal oscillator(＜200Mhz)in various packages.

 1 slot: 1 drive board configuration; total 8pcs; Each board is configurated with 2 sets of DC/DC converter and 40 channels of high speed D-signal, which helps DUT's vibration frequency transmit to the frequency meter for high-speed frequency test, and DUT frequency is real-time detected circularly



Test Standard
Product Parameters
Chamber
Brand
GWS/ESPEC PH-201
Dimension
600*600*600(mm)
Air circulating
Horizontal air circulating design
Temperature
Ambient~150℃
Temp. uniformity
125℃±3℃(null load); Fluctuation:±0.5℃
Capacity
Zone QTY.
4
Slot
16
DUT per slot/ Total
40/640 (DUT QTY.related to package; Larger package, less DUT per board)
Bulk Power Supply
QTY.
4 sets(standard configuration)
Output
20.0V/60.0A
DC/DC Converter
Output
Vcc1：15.00V/10.0A；Vcc2：15.00V/10.0A
Note
Each index test point of each DC/DC converter is the power output terminal
Frequency generation
Type
Keysight-Frequency meter
Range
100Hz～120MHz
Driver Board
QTY.
16pcs
Bulk PS voltage detection
Range：0.0～99.9V； Accuracy：±(1％＋1LSB)
Current detection
Range：0.0～99.9A； Accuracy：±(1％＋1LSB)
DC/DC converter voltage detection
Range：0.00～10.00V； Accuracy：±(1％＋1LSB)
Current detection
Range：0.00～10.00V； Accuracy：±(1％＋1LSB)
Frequency detection
Range：100Hz～120MHz;
Burn-in Board
Substrate material
High Tg substrate
Temp. up to
150℃ / 175℃ / 200℃
Dimension
290*600(mm)
Equipment
Dimension
1430W*1400D*2000H(mm)
Electrical requirement
A.C.220V±10％ / 50Hz
Power/Weight
8KW / 600KG
Others
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