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BTD-E810(IOL-△Tj test)
Discrete Device IOL Burn-in System

The system is designed to meet AEC-101 spec. And can perform IOL test for discrete device such as diode, transistor, MOS FET etc.

Each DUT △Tj can be monitored during the whole test period.


K-factor tester


Test Standard
Product Features
Product Parameters
Chamber
Dimension
60(L)*30(W)*12.5(H)(cm)
Air circulating
Horizontal air circulating design;PWM fan control(Optional heating module)
QTY.
16 sets
Capacity
Slot
16
DUT per slot
All DUTs △Tj test: 24 DUT positions; Sample DUT △Tj test: 80 DUT positions
Total capacity
284/1280 DUT positions
Power Supply
QTY.
8 sets
Output
0-60V / 2400W; multiple models available
Driver Board
QTY.
16pcs
Constant current source
Per slot 4 channels with 20A output each; Up to 60 A when parallel connection(for IGBT uni-transistor)
Test voltage detection
Range:0.00V~99.9V;Accuracy:±1%+0.01V
Test current detection
Diode Id range:0.1A~60.0A;Transistor/MOS Id range: 0 mA~400.0mA;Accuracy:1%+1LSB
Vf detection accuracy
±0.5mV
Tj test
Range:20℃~175℃;Accuracy:1%+1LSB
Im generation range/accuracy
0~99.9mA ; ±1%+0.1mA
Burn-in Board
Structure
Universal mother board(3 types)+varies daughter board
Socket
With high temperature resistant, anti-oxidation and fatigue resistant materials
Dimension
290*600(mm)
Equipment
Dimension
1730W*1150D*1900H(mm)
Electrical requirement
A.C.220V±10% / 50Hz
Power/Weight
15KW / 700kg
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