IC High Temp. Dynamic Burn-in System-Standard type
The system is designed to perform High temp. dynamic burn-in screening & life test for various packages' IC devices such as Analog,Digital,Mixed signal IC, including Memory, VLSI.
Test Standard
Product Features
Auto-jumper
Auto loading of each channel's I/O attributes thru software instead of manual operation.
Digital signal
with a digital signal generation capability up to10M, and a high-frequency digital signal transmission and matching design
Analog signal
with 4 analog signal generation and driving modules, which can be well applied to the loading of analog and digital-analog hybrid ICs
Digital signal detection
with 64 digital signal detection loops, real-time read back of frequency and amplitude parameters of DUT's I/O signal.