中安
中安
BTI-E3000AT(16 slots)
IC High Temp. Dynamic Burn-in System-Standard type

The system is designed to perform High temp. dynamic burn-in screening & life test for various packages' IC devices such as Analog,Digital,Mixed signal IC, including Memory, VLSI.

Test Standard
Product Features
Product Parameters
Chamber
Brand
GWS/ESPEC PH-201
Dimension
600*600*600(mm)
Air circulating
Horizontal air circulating design
Temperature
Ambient~175℃
Temp. uniformity
125℃±3℃(null load); Fluctuation:±0.5℃
Capacity
Zone
16 (1 zoen: 1 slot)
Slot
16
DUT per slot/ Total
208/3328(DIP14)
Power Supply
QTY.
8-16sets
Output
±30V / 40A
Driver Board
QTY.
16pcs
Vcc / Vmux / Vclk
2.00V~18.00V / 10A
Vee
-2.00V~-18.00V / 10A
Ripple(RMS)
<10mV
Analog signal(4 channels)
100KHz, 0V~ ± 10.0V / 1.0A
Digital signal(64 channels)
10MHz / 8M vector
Read-back signal
Frequency,Amplitude
Addressability
64G bits
Burn-in Board
Substrate material
High Tg substrate
Temp. up to
150/175℃ option
Dimension
290*600(mm)
Equipment
Dimension
1430W*1400D*2000H(mm)
Electrical requirement
A.C.220V±10% / 50Hz
Power/Weight
10KW / 600KG
Others
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