适用器件额定试验功率在20W~300W的MOS管、达林顿管,
并兼容部分三极管功率器件的控壳温状态下稳态寿命试验和功率老炼筛选。
适用于 F0、F1、F2(细)、F2-3(粗)、TO-3P等封装
The system can perform CFOL test and power burn-in screening with Tc controlled for MOS&Darlinton transistor with rating power 20W~300W, and part of transistors.
Applicable to F0, F1, F2 (fine), F2-3 (coarse), To-3P and other packages.